Preparation and study the structural and optical properties of PS.Cu(etx)2 thin films for UV shield application
DOI:
https://doi.org/10.47831/mjpas.v4i2.390Keywords:
Polystyrene, PS.Cu(etx)2, Thin films, UV shieldAbstract
Thin films of polystyrene PS and polystyrene doped by copper complex Cu(etx)2, have been prepared on glass (quartz and pyrex) substrates by the spin coating method. The effect of Cu(etx)2 weight ratios (0, 0.02, 0.04, 0.06) wt% on the morphology, structural, and optical properties have been studied. The X-ray diffraction results showed that the pure PS thin films have an amorphous structure. Adding Cu(etx)2 improves the crystalline structure by turning it into a polycrystalline state. FE-SEM images showed that the morphology of all samples was almost similar, smooth, and with few defects. The optical measurements showed that in general, PS and PS.Cu(etx)2 thin films exhibited high absorption in the UV region and increased with Cu(etx)2 weight ratios, as well as a high absorption coefficient (α>104cm-1) in the visible range with a direct allowed optical energy band gap Eg, and its value decreased from 3.8 eV for PS thin films to 3.05 eV for PS.Cu(etx)2 thin films with 0.06 wt%. The research focused on the preparation of UV shield thin films as a practical application of the current study.
Downloads
Published
Issue
Section
License
Copyright (c) 2026 Israa Akram Abba, Wasan Adeeb Fadhil, Anwar abd Alzahraa Mohammed, Tariq Alwan

This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.